Vth International Congress on X-Ray Optics and...

Main
Physics
Vth International Congress on X-Ray...

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

U. Bonse (auth.), Professor Dr. G. Möllenstedt, Dr. K. H. Gaukler (eds.)

0 / 0

Quanto Você gostou deste livro?

Qual é a qualidade do ficheiro descarregado?

Descarregue o livro para avaliar a sua qualidade

De que qualidade são os ficheiros descarregados?

Categorias:

Ano:

1969

Edição:

1

Editora:

Springer-Verlag Berlin Heidelberg

Idioma:

german

Páginas:

612

ISBN 10:

366224778X

ISBN 13:

9783662247785

Arquivo:

PDF, 29.71 MB

IPFS:

,

german, 1969

Este livro não está disponível para download devido à reclamação do detentor dos direitos autorais

Beware of he who would deny you access to information, for in his heart he dreams himself your master

— Pravin Lal

Você pode estar interessado em

A. J. Tousimis and L. Marton (Eds.) — Electron Probe Microanalysis

Thomas Hutchinson (Eds.) — Microprobe Analysis of Biological Systems

Claude Lechene (Eds.) — Microbeam Analysis in Biology

D. C. Sigee — X-ray microanalysis in biology: experimental techniques and applications

Joseph I. Goldstein & Dale E. Newbury & Joseph R. Michael & Nicholas W.M. Ritchie & John Henry J. Scott & David C. Joy — Scanning Electron Microscopy and X-Ray Microanalysis

Peter Ingram — Biomedical applications of microprobe analysis

Bernard C. Breton, Dennis McMullan, and Kenneth C.A. Smith (Eds.) — Sir Charles Oatley and the Scanning Electron Microscope

Gerald Oster (Eds.) — Optical Techniques. Physical Techniques in Biological Research

Bell, David C.; Garratt-Reed, Anthony J — Energy-dispersive X-ray analysis in the electron microscope

D. K. Bowen, C. R. Hall (auth.) — Microscopy of Materials: Modern Imaging Methods Using Electron, X-ray and Ion Beams

Lawrence E Murr (Editor) — Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,

D Williams (Editor); R Shimizu (Editor) — Microbeam Analysis: Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000

James V. P. Long (auth.), Philip J. Potts, John F. W. Bowles, Stephen J. B. Reed, Mark R. Cave (eds.) — Microprobe Techniques in the Earth Sciences

David Brandon, Wayne D. Kaplan — Microstructural Characterization of Materials

Ian M Watt — The principles and practice of electron microscopy

S. J. B. Reed — Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

D. Kennedy Williams; Shimizu, Ryūichi; Williams, David Bernard — Microbeam Analysis 2000 : Proceedings of the Second Conference of the International Union of Microbeam Analysis Societies Held in Kailu a-Koma, Hawaii (Institute of Physics Conference Series)

M. A. Hayat Ph.D. (eds.) — X-Ray Microanalysis in Biology

S. Chiang, R. J. Wilson (auth.), Ralph Feder, J. Wm. McGowan, Douglas M. Shinozaki (eds.) — Examining the Submicron World

Colin J. R. Sheppard (auth.), P. C. Cheng, T. H. Lin, W. L. Wu, J. L. Wu (eds.) — Multidimensional Microscopy

H. H. Pattee, V. E. Cosslett and Arne Engström (Eds.) — X-ray Optics and X-ray Microanalysis

Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy — Scanning Electron Microscopy and X-Ray Microanalysis

Angus I Kirkland, Sarah J Haigh (eds.) — Nanocharacterisation

DC Bell — Energy-dispersive X-ray analysis in the electron microscope

S. Amelinckx, Dirk van Dyck, J. van Landuyt, Gustaaf van Tendeloo — Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry 3 Volume Set

Professor Dr. Ludwig Reimer (auth.) — Transmission Electron Microscopy: Physics of Image Formation and Microanalysis

Professor Dr. Ludwig Reimer (auth.) — Scanning Electron Microscopy: Physics of Image Formation and Microanalysis

Nicolas Brodusch,Hendrix Demers,Raynald Gauvin (auth.) — Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

Nicolas Brodusch, Hendrix Demers, Raynald Gauvin — Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

Frases chave